Quality aspects in spatial data mining

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Bibliographic Details
Other Authors: Bijker, Wietske, ed, Shi, Wenzhong, ed, Stein, Alfred, ed
Format: Book
Language:English
Published: Boca Raton : CRC Press , 2009
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Description
Physical Description:xx, 356p.: ill ; 24cm
Bibliography:Index: pp 357-64
ISBN:9781420069266